Radiant energy – Inspection of solids or liquids by charged particles – Methods
Patent
1986-01-06
1987-09-29
Church, Craig E.
Radiant energy
Inspection of solids or liquids by charged particles
Methods
250310, 250397, 378 45, 378 46, 378 48, G01N 23225, G01N 23223
Patent
active
046970800
ABSTRACT:
A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.
REFERENCES:
patent: 2418029 (1947-03-01), Hillier
patent: 3146347 (1964-08-01), Ziegler
patent: 3204095 (1965-08-01), Watanabe
patent: 3612861 (1971-10-01), Dorfler
patent: 3694635 (1972-09-01), Hoetzel
patent: 4037101 (1977-07-01), Okumura et al.
patent: 4288692 (1981-09-01), Schamber et al.
patent: 4355232 (1982-10-01), Todokoro et al.
patent: 4357536 (1982-11-01), Varma et al.
Allen, Philosophical Magazine A, 1981, vol. 43, No. 2, 325-335.
Philibert et al., J. Phys. D. Appl. Phys., vol. 11, No. 3, Nov. 1970, pp. L70-L72.
Berman Jack I.
Church Craig E.
Higgins Michael J.
Hightower Judson R.
Lohff William
LandOfFree
Analysis with electron microscope of multielement samples using does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Analysis with electron microscope of multielement samples using , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analysis with electron microscope of multielement samples using will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1590684