Analysis of integrated circuits for high frequency performance

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

active

07082585

ABSTRACT:
Disclosed is a method of analyzing an integrated-circuit system that is accurate for high frequency analysis and can predict problems at high frequencies that do not occur when the circuit is used at lower frequencies.

REFERENCES:
patent: 6161215 (2000-12-01), Hollenbeck et al.
patent: 6539531 (2003-03-01), Miller et al.
patent: 6564355 (2003-05-01), Smith et al.
patent: 6845491 (2005-01-01), Miller et al.
patent: 2003/0115568 (2003-06-01), Miller et al.

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