Coded data generation or conversion – Converter calibration or testing
Patent
1998-12-08
2000-08-08
Phan, Trong
Coded data generation or conversion
Converter calibration or testing
H03M 110
Patent
active
061008281
ABSTRACT:
An analog-to-digital converter test system and method 10 is provided that comprises a digital-to-analog converter system 26. An analog-to-digital converter system 32 is tested using an internal analog input signal 30 generated by the digital-to-analog converter system 26. The digital-to-analog converter system 26 generates the internal analog input signal 30 from an internal digital input signal 24 generated by a programmable data ramp controller 14. The programmable data ramp controller 14 produces a high precision internal digital input signal 24 with predetermined start and stop voltage values 16 repeated over a fixed frequency determined by a programmable divide circuit 18.
REFERENCES:
patent: 5909186 (1999-06-01), Gohringer
Brady III Wade James
Phan Trong
Stewart Alan K.
Telecky Jr. Frederick J.
Texas Instruments Incorporated
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