Analog-to-digital converter

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257363, 257379, 257358, 257486, H01L 298605

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active

054811295

ABSTRACT:
A two-step analog-to-digital converter and BiCMOS fabrication method. The fabrication method provides pseudosubstrate isolation of digital CMOS devices from the analog devices. The converter uses NPN current switching in a flash analog-to-digital converter and in a digital-to-analog converter for low noise operation. CMOS digital error correction and BiCMOS output drivers provide high packing density plus large output load handling. Timing control aggregates switching events and puts them into intervals when noise sensitive operations are inactive. The fabrication method uses a thin epitaxial layer with limited thermal processing to provide NPN and PNP devices with large breakdown and Early voltages. Laser trimmed resistors provide small long term drift due to dopant stabilization in underlying BPSG and low hydrogen nitride passivation.

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IBM Technical Disclosure Bulletin, vol. 10, No. 4, Sep. 1967, New York, U.S., p. 490, Pliskin W. A. et al., "Low Temperature Methods of Densifying SiO2 and Glass Films".
Japan Kokai Abstract, 63-248157, Oct. 14, 1988., Matsumoto.
Japan Kokai Abstract, 03-042823, Feb. 25, 1991, Yoshio.

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