Analog-to-digital and digital-to-analog conversion window...

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

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C365S185030, C365S185170, C365S185200

Reexamination Certificate

active

07995412

ABSTRACT:
An analog-to-digital conversion window is defined by reference voltages stored in reference memory cells of a memory device. A first reference voltage is read to define an upper limit of the conversion window and a second reference voltage is read to define a lower limit of the conversion window. An analog voltage representing a digital bit pattern is read from a memory cell and converted to the digital bit pattern by an analog-to-digital conversion process using the conversion window as the limits for the sampling process. This scheme helps in real time tracking of the ADC window with changes in the program window of the memory array.

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Inoue et al. “NAND Flash Applications Design Guide: System Solutions from Toshiba America Electronic Components, Inc.” Apr. 2003. pp. 1-29.

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