Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-11-21
2006-11-21
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07139987
ABSTRACT:
In an automated integrated circuit design, if the performances of a layout of circuit devices are not within predetermined tolerances of performance specifications, at least one of the circuit devices is resized or repositioned and an updated value of a device parameter for each resized or repositioned circuit device is determined. A difference between the initial and updated value of each device parameter is then determined and each difference is combined with a ratio formed from changes in the value of one of the device parameters and changes in the value of one of the performances affected by the device parameter. The result of this combination is then combined with the initial value of the performance to determine an updated value therefor.
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Dengi Enis Aykut
Rohrer Ronald A.
Zhang Gang
Bowers Brandon W.
Cadence Design Systems Inc.
Chiang Jack
Morrison & Foerster / LLP
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