Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2006-01-10
2006-01-10
Nguyen, John B (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S118000, C341S126000
Reexamination Certificate
active
06985098
ABSTRACT:
DC offset is compensated for in an analog front end (AFE) circuit having an amplifier and an analog-to-digital converter (ADC). First data processed by the ADC are low pass filtered and estimated DC offset data of the ADC are obtained in ADC DC offset calibration mode. Second data processed by the ADC and the amplifier are low pass filtered, and a first DC offset of the ADC are substantially removed from the filtered second data by subtracting the estimated DC offset data from the filtered second data, thereby obtaining second compensated DC offset data of the amplifier in an amplifier DC offset calibration mode. The second compensated DC offset data is iteratively improved and first compensated DC offset data of the amplifier are obtained. The first compensated DC offset data are transformed into an analog signal, and the analog signal is subtracted from an input signal of the amplifier during operation mode.
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Mills & Onello LLP
Nguyen John B
Samsung Electronics Co,. Ltd.
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