Ambient air refracture index measuring device

Details Ambient air refracture index measuring device Ambient air refracture index measuring device

1992-10-06

1995-02-28

McGraw, Vincent P.

Optics: measuring and testing

By polarized light examination

With birefringent element

356130, G01N 2145

Patent

active

053942442

ABSTRACT:
An improved laser refractometer (10) employing a interferometer optical component (12), an object mirror (14) and an etalon (16). The etalon (16) is moved in the path of a plurality of reference beams (22, 24) and a plurality of measurement beams (26, 28) such that the reference beams (22, 24) travel through a vacuum within the etalon while the measurement beams (26, 28) travel a like distance through the etalon (16) in ambient air. In varying the distance traveled by the laser beams (22, 24, 26, 28) within the etalon (16) any interference fringes detected by an interference fringe detection device (20) are attributable to differences in the optical paths of the measurement beams (26, 28) as compared to that of the reference beams (22, 24) which, in turn, is entirely attributable to the ambient index of refraction. In a first preferred embodiment of the improved refractometer (10) the angular distance between a pair of plates (30, 32) is varied by rotation of the etalon (16). In an alternate embodiment of the etalon (516), the distance between plates (530, 532) is varied by linear displacement of the etalon (516).

REFERENCES:
patent: 3450476 (1969-06-01), Rando
patent: 4733967 (1988-03-01), Sommargren
patent: 4765741 (1988-08-01), Detro et al.
patent: 5177566 (1993-01-01), Leuchs et al.

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