Alicyclic unsaturated compound, polymer, chemically...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S325000, C430S326000, C430S907000, C526S242000, C526S247000, C526S268000, C526S281000, C526S332000, C526S333000, C568S665000, C568S667000, C568S669000, C568S817000, C568S579000, C570S130000, C570S142000

Reexamination Certificate

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07470499

ABSTRACT:
A noble alicyclic unsaturated compound represented by the general formula (1): wherein at least one of R1and R2is a fluorine atom or a fluorinated alkyl group; a polymer formed by the polymerization of a polymer precursor comprising the alicyclic compound. The polymer is useful, in the lithography using a light having a wavelength of 190 nm or less, as a chemically amplified resist which exhibits excellent transparency with respect to the light for use in exposure and also is excellent in the adhesion to a substrate and the resistance to dry etching.

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patent: 6673523 (2004-01-01), Kishimura et al.
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patent: 7264914 (2007-09-01), Feiring et al.
patent: 2002/0009668 (2002-01-01), Nishimura et al.
patent: 2002-338690 (2002-11-01), None
patent: WO 02/079287 (2002-10-01), None
R.R. Kunz, et al., “Outlook for 157 nm resist design”, J. Vac.Sci. Technology, B17(6), Nov./Dec. 1999, 1999 American Vacuum Society, pp. 3267-3272.
Takashi Chiba, et al., “157nm Resist Materials: A Progress Report”, Journal of Photopolymer Science and Technology, vol. 13, No. 4(2000), pp. 657-664.
Joice P. Mathew, et al., “(n3-Allyl)palladium(II) and Palladium(II) Nitrile Catalysts for the Addition Polymerization of Norbornene Derivatives with Functional Groups”, Macromolecules 1996, vol. 29, No. 8, pp. 2755-2763.
Notification Concerning Transmittal of Copy of International Preliminary Report on Patentability (Chapter 1 of the Patent Cooperation Treaty) Form PCT/IB/326 dated Sep. 22, 2005.

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