Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-06-20
2006-06-20
Lee, Eddie (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S077000, C257S335000, C257S288000, C257S487000, C257S185000, C257S655000, C257S360000, C257S355000, C257S297000, C257S431000
Reexamination Certificate
active
07064399
ABSTRACT:
The present invention is a method for forming super steep doping profiles in MOS transistor structures. The method comprises forming a carbon containing layer (110) beneath the gate dielectric (50) and source and drain regions (80) of a MOS transistor. The carbon containing layer (110) will prevent the diffusion of dopants into the region (40) directly beneath the gate dielectric layer (50).
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Babcock Jeffrey A.
Balster Scott
Haeusler Alfred
Howard Gregory E.
Pinto Angelo
Brady III W. James
Im Junghwa
Lee Eddie
McLarty Peter K.
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