Advance ridge structure for microlens gapless approach

Semiconductor device manufacturing: process – Including control responsive to sensed condition – Optical characteristic sensed

Reexamination Certificate

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C438S024000, C438S048000, C438S070000, C438S073000, C438S698000, C257SE33068

Reexamination Certificate

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11064452

ABSTRACT:
A method of manufacturing a plurality of microlenses on a substrate comprises forming a grid having raised ridges defining a plurality of openings on the substrate and forming a plurality of patterned photoresist features each disposed within one of the plurality of openings. The plurality of patterned photoresist features can then be reflowed inside the grid.

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patent: 2005/0200960 (2005-09-01), Tang
patent: 2005/0287479 (2005-12-01), Moon
Ghandhi, VLSI Fabrication Principles, 1983, John Wiley & Sons, pp. 542-546.

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