Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-04-17
2007-04-17
Menz, Doug (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S422000
Reexamination Certificate
active
11117713
ABSTRACT:
A magnetoresistive memory element includes a stacked structure with a ferromagnetic reference region including a fixed magnetization; a ferromagnetic free region including a free magnetization that is free to be switched between oppositely aligned directions with respect to an easy axis thereof; and a tunneling barrier made of a non-magnetic material. The ferromagnetic reference and free regions and the tunneling barrier together form a magnetoresistive tunneling junction. The ferromagnetic free region includes a plurality of N ferromagnetic free layers being magnetically coupled such that magnetizations of adjacent ferromagnetic free layers are in antiparallel alignment, where N is an integer greater than or equal to two. The ferromagnetic free region further includes at least one ferromagnetic decoupling layer including frustrated magnetization in orthogonal alignment to ferromagnetic free layer magnetizations and being arranged in between adjacent ferromagnetic free layers.
REFERENCES:
patent: 5686838 (1997-11-01), Van Den Berg
patent: 6531723 (2003-03-01), Engel et al.
patent: 6545906 (2003-04-01), Savtchenko et al.
patent: 6639291 (2003-10-01), Sin et al.
Beer Peter
Klostermann Ulrich
Ruehrig Manfred
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Menz Doug
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