Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2011-04-05
2011-04-05
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S201000, C365S230080
Reexamination Certificate
active
07920437
ABSTRACT:
An address control circuit for a semiconductor memory apparatus so as to make a refresh operation test possible by designating a refresh address is presented. The circuit includes a buffer block, a decoder, and a latch block. The buffer block receives coding information coded testing address information in accordance to a test signal. The decoder generates a test refresh address by decoding the coding information. The latch block latches the test refresh address depending on the test signal.
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Hynix / Semiconductor Inc.
Ladas & Parry LLP
Nguyen Tan T.
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