Acid-cleavable radiation-sensitive compounds, radiation-sensitiv

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

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430176, 430270, 430286, 430292, 430300, 430302, 430323, 430326, 430914, 430919, 430925, G03C 173, G03C 1725, G03F 7025, G03F 7027

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053468066

ABSTRACT:
Ligomeric sulfonic acid derivatives having repeating units of the formula I ##STR1## in which R.sup.1 is an alkyl, haloalkyl or aryl radical,

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Schlegel et al., "Highly Sensitive Positive Deep UV Resist Utilizing a Sulfonate Acid Generator and a Tetrahydropyranyl Inhibitor," Microelectronic Engineering, vol. 13, pp. 33-36 (Mar. 1991).
CA 116(24):245275k, "Positive Working Radiation Sensitive Composition and Radiation-Sensitive Recording Material for Exposure Using UV-Radiation," Roeschert et al, Jun. 15, 1992.
C. Wilson, et al, "Introduction to Microlithography, Organic Resist Materials-Theory and Chemistry", ACS Symposium Series 219, 87, Mar. 20-25, 1983, pp. 88-159.
C. Petropoulos, "Synthesis of Novel Photodegradable Poly(o-Nitrobenzaldehyde Acetal) Polymers", J. Polym. Sci., Polym. Chem. Ed., 15, 1977, pp. 1637-1644.
F. M. Houlihan, et al, "An Evaluation of Nitrobenzyl Ester Chemistry for Chemical Amplification Resists", SPIE, vol. 920, 1988, pp. 67-74.

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