Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-03-01
2005-03-01
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C333S130000, C333S017300, C333S032000
Reexamination Certificate
active
06862714
ABSTRACT:
Resistors may be more accurately tuned by using an external resistor and comparing the value of an internal resistor to the value of the external resistor. The value of the internal resistor may be adjusted to match the value of the external resistor. Any number of on-chip resistors may then be matched and adjusted using the information obtained with respect to the first internal resistor.
REFERENCES:
patent: 5398261 (1995-03-01), Marbot
patent: 6628223 (2003-09-01), Nagano
patent: 20030102932 (2003-06-01), Lee et al.
DeHon et al., “Automatic Impedance Control,” 1993 IEEE Int'l Solid-State Circuits Conference, pp. 164-165, 283.*
Trotter et al., “A COMS Low Voltage High Performance Interface,” 1994 7th Annual IEEE Int'l ASIC Conference and Exhibit, pp. 44-48.
Dreyer Stephen F.
Hu Vivian
Jin Robert X.
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