Abrasive compound for CMP, method for polishing substrate...

Abrading – Abrading process – Utilizing fluent abradant

Reexamination Certificate

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Details

C438S693000, C451S041000, C451S059000, C451S063000

Reexamination Certificate

active

07410409

ABSTRACT:
The present invention discloses a CMP abrasive comprising cerium oxide particles, a dispersant, an organic polymer having an atom or a structure capable of forming a hydrogen bond with a hydroxyl group present on a surface of a film to be polished and water, a method for polishing a substrate comprising polishing a film to be polished by moving a substrate on which the film to be polished is formed and a polishing platen while pressing the substrate against the polishing platen and a polishing cloth and supplying the CMP abrasive between the film to be polished and the polishing cloth, a method for manufacturing a semiconductor device comprising the steps of the above-mentioned polishing method, and an additive for a CMP abrasive comprising an organic polymer having an atom or a structure capable of forming a hydrogen bond with a hydroxyl group present on a surface of a film to be polished, and water.

REFERENCES:
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patent: 6248143 (2001-06-01), Masuda et al.
patent: 6420269 (2002-07-01), Matsuzawa et al.
patent: 2003/0181046 (2003-09-01), Sachan et al.
patent: 0 373 501 (1990-06-01), None
patent: 0 820 092 (1998-01-01), None
patent: 0 846 740 (1998-06-01), None
patent: 410102040 (1998-04-01), None
patent: WO 99/64527 (1999-12-01), None
Supplementary European Search Report, for Application No. EP 00 93 7240, dated Oct. 24, 2002.

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