Aberration free lens system for electron microscope

Radiant energy – With charged particle beam deflection or focussing – Magnetic lens

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250396ML, H01J 3710

Patent

active

053368916

ABSTRACT:
A system for reducing aberration effects in a charged particle beam. The system includes a source of charged particles, such as electrons or ions, and various building blocks for operating on the charged particle beam to generate a desired particle beam pattern. These building blocks can include at least one of a uniform magnetic field component and a uniform electrostatic field component arrangeable in different combinations, enabling coefficients of spherical and chromatic aberration to be canceled out thereby providing a charged particle beam having greatly diminished aberration.

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