4. X-ray or gamma ray systems or devices
  5. Specific application
  6. Diffraction, reflection, or scattering analysis
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Plunkett Glenn A.

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Poranski Chester F.

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Porte David P.

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Proto Manufacturing Ltd.

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Pugh Myron A.

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QEL Inc.

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Qi Mingrui

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Quinn Duncan R.

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Rafaeli Tzachi

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Rapiscan Security Products, Inc.

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Reefman Derk

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Reflective X-Ray Optics LLC

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Regents of the University of Nebraska, Board of Varner Hall

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Retallack David James

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Reznikova Elena

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Riddle Eddie R.

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Rigaku Corp.

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Rigaku Denki Kabushiki Kaisha

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Rigaku/MSC, Inc.

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Rigaku/USA, Inc.

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