ICT Integrated Circuit Testing Gesellschaft fur, Halbleit Erpruf
Ikebe Yoshinori
Ikegami Naokatsu
Ilya Zborovsky
Imago Scientific Instruments
Interuniversitair Microelectronicka Centrum (IMEC)
Ion Tech Limited
Itoh Michiyasu
Itoh Noriaki
Iwasaki Kouji
Jaklitsch Lisa J.
James Dick
Janah Hakim
Janssen Augustus J.E.M.
Japan Science and Technology Corp.
Jarvis Suzanne Philippa
Jeong Hi Won
Jiyan Dai
Jo Chang Yong
Jones Suzanne R.