4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition
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Magniez Clement A. A.

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Makara Reiji

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Malkan David D.

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Marquis Eduardo

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Marshall, Gerstein and Borun LLP

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Marxer Norbert

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Matsunaga Ryouji

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Matsushita Hidekatsu

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Matsushita Seiki Co., Ltd.

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Maurer Fredrik

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Maxsys Technologies Corporation

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McCormick Richard J.

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Mcdermott Will & Emery LLP

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McIntosh John M.

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Mcmillan Wayne

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McMillan Wayne

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McNiven James Peter

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Meeks Steven

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Melanson Robert

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Microview Technologies Pte Ltd

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