4. Optics: measuring and testing
  5. Inspection of flaws or impurities
  6. Surface condition
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Valentin II Juan D

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Van Boxmeer Johan Maria

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Van der Donck Jacques Cor Johan

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Van Kessel Theodore G.

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Vasuta John A.

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Vella Eric N.

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Verhagen Erwin Theodorus Jacoba

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Vertoprakhov Victor

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Vink Henri Johannes Petrus

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Vistee Semiconductor Systems Jena GmbH

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Vo Khiem D.

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