4. Optics: measuring and testing
  5. By dispersed light spectroscopy
  6. With aperture mask
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Advanced Photometrics, Inc.

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Aspectrics, Inc.

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Belton Peter S.

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Bey Dawn-Marie

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Brooks Neil H.

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Canadian Instrumentation and Research

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Case William E.

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Claflin Edward S.

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Clarke Stanley P.

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Corcoran Stephan P.

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Erwin Sick GmbH - Optik-Elektronik

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Finkenthal Daniel

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Funk David J.

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Gehm Michael E.

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Glaus Ulrich Walter

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Guidedwave, Inc

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Hagler Thomas W.

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Hanley Quentin

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Hantis K. K.

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Heinz Robert Eric

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