LandOfFree - US Patents - Listing for Measuring and testing,Instrument proving or calibrating,Roughness or hardness

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Colonia Jorge Daniel

Inventor

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Do Huyen D.

Inventor

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Frusescu Dan

Inventor

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Hua Tuan H.

Inventor

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Komag Corporation

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Moy Connie H.

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Nunnelly Lewis L.

Attorney

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Prochazka J. Jerry

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Protsik Mark

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Robert James M.

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Scheer Bradley W.

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Shiraki Daryl M.

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Stover John C.

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Toyaba Jun

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VLSI Standards, Inc.

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Zhou Nalin

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