4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing
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Nagahashi Kenji

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Nagai Hajime

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Nagamine Ryouichirou

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Nagasaki Yoshimichi

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Nagya Mitsugu

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Nakako Takahisa

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Nakamoto Alan

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Nakao Michinobu

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Nalbantis Dimitris

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Nanba Kazuteru

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Napolitano Leonardo

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Narasingarao Bindu Dibbur

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Natarajan Udaya S.

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Natsume Koichiro

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Naum Michael C.

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Naveh Yehuda

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Nawrucki, Rooney, & Sivertson

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NEC Laboratories America, Inc

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NEC USA Inc.

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Needham Wayne Maurice

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