4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system
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Kirkendall Barry A.

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Kishine Yusuke

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Kishlock Teresa

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Kiso Tatsuroh

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Kitamaru Daisuke

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Kitazumi Hitoshi

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Klassen Steven R.

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Kline William A.

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Klinect David A.

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KMG2 Sensors Corporation

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Kneifel Marcus

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Knuth Randall J

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Kobalka Jordan D.

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Kochi University

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Koeck Gerd

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Kojima Seijirou

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Kolker David

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Köllner Wolfgang

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Kolonay Paul

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Kolwalkar Amol Rajaram

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