4. Data processing: measuring, calibrating, or testing
  5. Measurement system in a specific environment
  6. Electrical signal parameter measurement system
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Vahe Jari

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Vaidyanathan Kalyanaraman

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Van Biesen Leonard Pierre

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Van Der Auweraer Herman

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Van Epps Richard A.

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Van Gorp John C.

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Van Vlierberghe Pieter Frans

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van Zyl Gideon J.

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VanderWeele Ryan A.

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Vandevoorde Jean-Claude

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VanRemmen, Jr. William John

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Vegatoro Guillermo

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Veith Kristie

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Veith Kristie L.

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Venkatasubramanian Vaithianathan

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Venkatesh Usha H.

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Vijay Amrendra

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Vinci Stephen J.

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Vinden Jonathan Philip

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Vintola Ville

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