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Apparatus and a method of locating a source of acoustic emission

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and associated method for measuring differences in del

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for acoustic imaging using inverse scatteri

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for analyzing acoustical signals

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for analyzing the condition and performance

Measuring and testing – Vibration – Sensing apparatus
Patent

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Apparatus and method for automated non-destructive inspection of

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for automated non-destructive inspection of

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for beamforming in an ultrasonic transducer

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for binocular measurement system

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for binocular measurement system

Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate

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Apparatus and method for binocular measurement system

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for binocular measurement system

Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate

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Apparatus and method for binocular measurement system

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for bondtesting by ultrasonic complex imped

Measuring and testing – Vibration – Resonance – frequency – or amplitude study
Patent

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Apparatus and method for calculating vibration displacement...

Measuring and testing – Vibration – Sensing apparatus
Reexamination Certificate

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Apparatus and method for characterizing an acoustic field

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for characterizing semiconductor wafers dur

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for characterizing semiconductor wafers dur

Measuring and testing – Vibration – By mechanical waves
Patent

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Apparatus and method for characterizing semiconductor wafers...

Measuring and testing – Vibration – By mechanical waves
Reexamination Certificate

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Apparatus and method for comparing corresponding acoustic resona

Measuring and testing – Vibration – Resonance – frequency – or amplitude study
Patent

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