Measuring and testing – Vibration – By mechanical waves
Patent
1995-06-07
1997-05-06
Oda, Christine K.
Measuring and testing
Vibration
By mechanical waves
73620, G01N 2906
Patent
active
056273207
ABSTRACT:
A display system for non-destructive inspection of integrated circuit packages is disclosed for producing acoustical reflected images from selected planes within an integrated circuit package to detect flaws within the package.
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Braden Stanton C.
Brady III W. James
Donaldson Richard L.
Oda Christine K.
Texas Instruments Incorporated
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