LandOfFree - US Patents - Listing for Image analysis

Image analysis – Image enhancement or restoration

Weighted overcomplete de-noising

Image analysis – Image enhancement or restoration

Weighted overcomplete de-noising

Image analysis – Histogram processing – For setting a threshold

Weighted-pixel characteristic sensing system

Image analysis – Applications – Manufacturing or product inspection

Weld bead quality determining apparatus

Image analysis – Pattern recognition – Classification

Wheelchair detection using stereo vision

Image analysis – Image enhancement or restoration – Intensity – brightness – contrast – or shading correction

White balance adjustment

Image analysis – Image transformation or preprocessing – Image storage or retrieval

White level information correction apparatus for image reading a

Image analysis – Image enhancement or restoration – Intensity – brightness – contrast – or shading correction

White level setting system for an image scanner

Image analysis – Image segmentation

White line detection apparatus and white line detection method

Image analysis – Color image processing

White point determination using correlation matrix memory

Image analysis – Color image processing – Color correction

White point estimation using color by convolution

Image analysis – Image segmentation – Distinguishing text from other regions

White space graphs and trees for content-adaptive scaling of...

Image analysis – Image transformation or preprocessing – Combining image portions

Whiteboard imaging system

Image analysis – Image transformation or preprocessing – Combining image portions

Whiteboard imaging system

Image analysis – Image sensing

Whiteboard imaging system

Image analysis – Image transformation or preprocessing – Measuring image properties

Whole order orientation method and apparatus

Image analysis – Histogram processing – For setting a threshold

Whole word, phrase or number reading

Image analysis – Histogram processing – For setting a threshold

Whole-leg X-ray image processing and display techniques

Image analysis – Applications – Manufacturing or product inspection

Whole-wafer photoemission analysis