Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
Inventor
active
Anti-reflective coatings for use at 248 nm and 193 nm
Method of preventing resist poisoning in dual damascene...
Method of preventing resist poisoning in dual damascene...
No associations
LandOfFree
Hiroaki Takikawa does not yet have a rating. At this time, there are no reviews or comments for this inventor.
If you have personal experience with Hiroaki Takikawa, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Hiroaki Takikawa will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-P-2725512