Measuring and testing – Liquid analysis or analysis of the suspension of solids in a... – Content or effect of a constituent of a liquid mixture
Patent
1998-01-21
2000-04-25
Moller, Richard A.
Measuring and testing
Liquid analysis or analysis of the suspension of solids in a...
Content or effect of a constituent of a liquid mixture
73 6149, 137 2, G01N 3300
Patent
active
060530324
ABSTRACT:
A system and a method are provided for detecting and monitoring changes in frequency in a process stream. At least one probe is placed in the process stream that is capable of detecting a change in frequency due to a build-up of mass on the probe from scale, corrosion, biofilm or the like in the process stream. A processor receives the signal produced by the probe to produce an output signal indicative of the change in frequency which is proportional to mass detected by the probe. A feeder is capable of feeding a product into the process stream as a result of the detected change in frequency of the probe to combat the mass build-up from scale, corrosion, biofilm or the like in the process stream. The system and method are further capable of measuring anti-scalant, corrosion inhibitor, biocide efficacy and controlling product feed into the process stream based on the determined efficacy.
REFERENCES:
patent: 3715911 (1973-02-01), Chuan
patent: 3863495 (1975-02-01), Schulz et al.
patent: 4547648 (1985-10-01), Longeway
patent: 4788466 (1988-11-01), Paul et al.
patent: 5112642 (1992-05-01), Wajid
patent: 5135852 (1992-08-01), Ebersole et al.
patent: 5201215 (1993-04-01), Granstaff et al.
patent: 5208162 (1993-05-01), Osborne et al.
patent: 5369033 (1994-11-01), DiMilia et al.
patent: 5484626 (1996-01-01), Storjohann et al.
patent: 5487981 (1996-01-01), Nivens et al.
Beck, Ralf et al. "Influence of the Surface Microbalance on the Coupling Between a Quartz Oscillator and a Liquid," in J. Electrochem. Soc., vol. 139, Feb. 1992, pp. 453-461.
Benje, Michael et al. "An Improved Quartz Microbalance: Applications to the Electrocrystallization and--dissolution of Nickel" in Ber. Bunsenges Phys. Chem., 90, VCH Verlagsgesellschaft mbH, 1986, pp. 435-439.
"Electrochemical Quartz Nanobalance," brochure by Elchema on the Model EQCN-500, Potsdam, NY.
"The Smart Plating and Etching Coupon System" brochure by Maxtek, Inc., Torrance, CA.
Chamberlain Jeffrey P.
Kraus Paul R.
Moriarty Barbara E.
Robertson Linda R.
Moller Richard A.
Nalco Chemical Company
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