Method and apparatus for selectively deriving a boosted voltage

Details Method and apparatus for selectively deriving a boosted voltage Method and apparatus for selectively deriving a boosted voltage

1995-11-07

1998-05-12

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3100, G01R 3128

Patent

active

057511586

ABSTRACT:
A self-booting test circuit is used in a semiconductor circuit to test an internal voltage of an integrated circuit. The test circuit is connected between a single input pin and single output pin to produce the internal voltage at the output pin in response to a high level voltage being applied to the input pin. The circuit includes two paths, one of which has a delay circuit used to increase the voltage level of a control signal used for gating the internal voltage to the output pin.

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patent: 5636115 (1997-06-01), Drouot

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