Process for fabricating a device

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

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430311, 430296, 430961, G03C 500, G03F 700

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active

057503125

ABSTRACT:
It has been found that surface reactions with basic materials such as amines found in the processing environment during lithographic processing contribute to a loss of linewidth control for resists such as chemically amplified resists. This loss in linewidth results from the reaction of the acid generated by exposing radiation with, for example, the amine resulting in a lack of chemical reaction where such reaction is desired. The problem is solved in one embodiment by employing an acid containing barrier layer on the resist.

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patent: 5240812 (1993-08-01), Conley
Kosar Light Sensitive Systems Wiley & Sons, Inc. 1965, pp. 339, 342.
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Japanese Patent Application No. 50-152803, published Dec. 9, 1975. Translation: yes.
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Japanese Patent Application No. 62-79441, published Apr. 11, 1987. Translation: yes.
Japanese Patent Application No. H03-507106 (PCT Counterpart No. 92/05474, published Apr. 2, 1992).
Semiconductor Lithography, W. M. Moreau, Plenum Press, N.Y., 1988, Chapter 6.
Microelectronic Engineering 1, C. G. Willson, et al., 269 (1983).
Journal of the Electrochemical Society, 133, 181 (1986) Willson et al.

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