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Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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1566311, 1566571, 216 2, 216 36, 216 56, 257347, H01L 2100

Patent

active

057500002

ABSTRACT:
A semiconductor device having a substrate with an insulating surface and a non-porous semiconductor region bonded to the body of the device. A porous semiconductor region on the surface of the substrate was removed by etching.

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Silicon-On Insulator Technology and Devices, W. P. Maszara, vol. 90-6, 1990, pp. 199-212B, "SOI by Wafer Bonding: A Review".
Journal of Applied Physics, vol. 64, No. 10, Nov. 15, 1988, pp. 4943-4950, W.P. Maszara et al., "Bonding of Silicon Wafers For Silicon-On-Insulator".
Applied Physics Letters, vol. 43, No. 3, Aug. 1, 1983, pp. 263-265, M. Kimura et al., "Epitaxial Film Transfer Technique For Producing single crystal Si Film on an Insulating Substrate".
1989 IEEE SOS/SOI Technology Conference, 1989, pp. 64-65, A. Soderbarg, "Fabrication of Besoi-Materials Using Implanted Nitrogen As An Effective Etch Stop Barrier".

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