Monitoring technique for accurately determining residual capacit

Details Monitoring technique for accurately determining residual capacit Monitoring technique for accurately determining residual capacit

1998-12-23

2000-12-05

Wong, Peter S.

Electricity: battery or capacitor charging or discharging

Battery or cell discharging

With charging

320130, H02J 700

Patent

active

061571695

ABSTRACT:
A battery monitoring system determines an accurate residual capacity of a battery in consideration of variation of battery temperature, amount of battery self-discharge, and amount of battery discharge from a host device, such as a portable computer. The monitoring system further determines a predicted remaining operating time of the device. The battery capacity measuring apparatus includes a microcontroller, a battery pack, a battery temperature detection circuit, a battery voltage detection circuit, a load current detection circuit, and a power saving level detector. The microcontroller is coupled to a host device such that it indicates the battery residual capacity along with the remaining operating time of the device via a display. The microcontroller calculates the residual capacity of the battery based on the detected battery voltage and a correction is made to the calculated residual capacity according to the battery temperature signal and the load current signal, the corrected resultant residual capacity being fed to the host device so as to display the residual capacity of the battery. Also, the microcontroller calculates the remaining operating time of the device based on the detected load current and a correction is made thereto according to the set power saving level of the device, the resultant remaining operating time being fed to the host device so as to display the corrected remaining operating time of the device.

REFERENCES:
patent: 4870526 (1989-09-01), Maruta et al.
patent: 5012176 (1991-04-01), LaForge
patent: 5191291 (1993-03-01), Taylor
patent: 5341084 (1994-08-01), Gotoh et al.
patent: 5341503 (1994-08-01), Gladstein et al.
patent: 5394089 (1995-02-01), Clegg
patent: 5412307 (1995-05-01), Yoshimatsu
patent: 5422822 (1995-06-01), Toyota et al.
patent: 5444378 (1995-08-01), Rogers
patent: 5518835 (1996-05-01), Simmonds
patent: 5541489 (1996-07-01), Dunstan
patent: 5545969 (1996-08-01), Hasegawa
patent: 5561362 (1996-10-01), Kawamura et al.
patent: 5563496 (1996-10-01), McClure
patent: 5592094 (1997-01-01), Ichikawa
patent: 5600230 (1997-02-01), Dunstan
patent: 5606243 (1997-02-01), Sakai et al.
patent: 5614829 (1997-03-01), Song
patent: 5617324 (1997-04-01), Arai
patent: 5631540 (1997-05-01), Nguen
patent: 5635842 (1997-06-01), Yokoo et al.
patent: 5648717 (1997-07-01), Uskali
patent: 5650712 (1997-07-01), Kawai et al.
patent: 5652502 (1997-07-01), van Phuoc et al.
patent: 5656919 (1997-08-01), Proctor et al.
patent: 5659240 (1997-08-01), King
patent: 5672973 (1997-09-01), Arai et al.
patent: 5680027 (1997-10-01), Hiratsuka et al.
patent: 5699050 (1997-12-01), Kanazawa
patent: 5703471 (1997-12-01), Bullock et al.
patent: 5710503 (1998-01-01), Sideris et al.
patent: 5744963 (1998-04-01), Arai et al.
patent: 5789923 (1998-08-01), Shimoyama et al.
patent: 5809449 (1998-09-01), Harper
patent: 5903131 (1999-05-01), Sekine et al.
patent: 5955869 (1999-09-01), Rathmann

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