Method of forming a semiconductor device

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156656, 156904, 430313, 430318, 437 51, 437180, 437245, H01L 21306, B44C 122, C23F 100

Patent

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053383974

ABSTRACT:
The present invention provides a method of forming a semiconductor device. A layer of photoresist is applied to a semiconductor wafer. A first mask is used to protect a first portion of the photoresist while a second portion of the photoresist is exposed. A second mask is used to expose a third portion of the photoresist wherein the third portion of the photoresist includes part of the first portion of the photoresist. The photoresist is developed to form a photoresist mask.

REFERENCES:
patent: 5100508 (1992-03-01), Yoshida et al.
patent: 5221429 (1993-06-01), Makuta
James B. Brinton, "E-Beam, Ultraviolet Photolithography Join In Single-Resist Step For Precision, Speed", Electronics, pp. 40-41, Nov. 30, 1981.

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