Single crystal of nitride and process for preparing the same

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

428694, 423111, H01L 2131

Patent

active

060017481

ABSTRACT:
A single crystal of a nitride having a length of not less than 10 mm, a width of not less than 10 mm and a thickness of not less than 300 .mu.m, or having a length of not less than 20 mm and a diameter of not less than 10 .mu.m. In the production of the single crystal, either a mixed powder composed of a nitride powder and an oxide powder or an amorphous nitride powder is provided as a source material powder, the source material powder is heated in a nitrogen atmosphere or in a nitrogen atmosphere containing hydrogen and/or carbon at a temperature below the sublimation temperature or melting temperature of the nitride to decompose and vaporize the nitride powder, and the decomposed and vaporized component is subjected to crystal growth from the vapor phase on a substrate. The nitride single crystal is useful as a bulk material for heat sinks, electric and electronic components, such as semiconductors, optical components, and components of electric equipment and office automation equipment.

REFERENCES:
patent: 4919689 (1990-04-01), Pyzik et al.
Nishida, K. et al., "Preparation of Li.sub.3 N Single Crystal by Floating Zone Technique", Journal of Crystal Growth, vol. 62, 1983, pp. 475-480.
Dryburgh, P.M., "The estimation of maximum growth rate for aluminum nitride crystals grown by direct sublimation", Journal of Crystal Growth 125, 1992, pp. 65-68.
Slack, G.A. et al., "AIN Single Crystals", Journal of Crystal Growth 42, 1977, pp. 560-563.
Slack, Glen A., et al, "Growth of High Purity Ain Crystals," Journal of Crystal Growth, vol. 34, 1976, pp. 263-279.
Grzegory, Izabella, et al, "Synthesis and Crystal Growth of A.sup.III B.sup.v Semiconducting Compounds Under High Pressure of Nitrogen," Physica Scripta, vol. T39, pp. 242-249.
Clancy, W.P., "A Limited Crystallographic and Optical Characterization of Alpha and Beta Silicon Nitride," Microscope, vol. 22, 1974, pp. 279-315.
Mishima, O., "Crystal Growth of Cubic Boron Nitride by Temperature Difference Method at .about.55kbar and .about.1800C," J. Appl. Phys., vol. 61, Apr. 15, 1987, pp. 2822-2825.
Kurai, Satoshi, et al, "Growth of Thick GaN on Sapphire Substrate by Sublimation Method," Department of Electrical and Electronic Engineering, Tokushima University, pp. 45-47.
Inomata, Yoshizo, et al, "Decomposition Temperature of Silicon Nitride in the System of Si.sub.3 N.sub.4 -C-N.sub.2 (1 atm)," pp. 441-444.
Inomata, Y., et al, "B-Si.sub.3 N.sub.4 Single Crystals Grown from Si Melts," Journal of Crystal Growth, vol. 21, 1974, pp. 317-318.
Niihara, K., et al, "Hot Hardness of CVD-Si.sub.3 N.sub.4 to 1500C," Powder Metallurgy International, vol. 16, No. 5, 1984, pp. 223-226.
Niihara, Koichi, et al, "Growth, Morphology and Slip System of a-Si.sub.3 N.sub.4 Single Crystal," Journal of Materials Science, vol. 14, 1979, pp. 1952-1960.
Kijima, K., et al, "Preparation of Slicon Nitride Single Crystals by Chemical Vapor Deposition," Journal of Crystal Growth, Col. 24/25, 1974, pp. 183-187.
Reimanis, Ivar E., et al, "Mechanical Properties of Single-Crystal a-Si.sub.3 N.sub.4," Journal of the American Ceramic Society, vol. 79, No. 8, 1996, pp. 2065-2072.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Single crystal of nitride and process for preparing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Single crystal of nitride and process for preparing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Single crystal of nitride and process for preparing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-863117

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.