Semiconductor device having a solid metal wiring with a contact

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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Details

257173, 361 91, H01L 2974, H01L 2362, H02H 320

Patent

active

055214134

ABSTRACT:
On the surface of a p-type semiconductor substrate, an n-type diffusion layer is formed. The diffusion layer is in contact with an aluminum wiring via a contact hole formed through an interlayer insulation layer to electrical connection. Immediately beneath the contact portion of the aluminum wiring, a contact n-type diffusion layer having higher impurity concentration than the n-type diffusion layer and having deeper junction depth. Outside of the contact n-type diffusion layer is surrounded by a low impurity concentration n well. With the construction, when an electrostatic pulse is applied to an external terminal connected to the shallow diffusion layer, junction breakdown of the diffusion layer can be successfully prevented.

REFERENCES:
patent: 3646411 (1972-02-01), Iwasa
patent: 4984031 (1991-01-01), Rinderle
patent: 5362980 (1994-11-01), Gough

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