Simulation device and method

Details Simulation device and method Simulation device and method

1998-06-19

1999-10-26

Chung, Phung M.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

G06K 504, G11B 500

Patent

active

059745754

ABSTRACT:
The simulation device and method exhaustively checks for the influence of skew in external input signals caused by numerous instances of unspecified tester skew to prevent testing problems when testing ICs such as ASIC before shipment. The simulation device is provided with a sequential circuit detection processor 1 that detects all first-stage sequential circuit elements 17 that may be affected by tester skew and outputs sequential circuit element information, a skew value library 4 for simulation use to which is added tester skew value fluctuation, and a data substitution section 3 that directs operation execution to an arithmetic section 6, transcribes prescribed data of the skew value library 4 to a normal library 5, and substitutes data of a net list 7.

REFERENCES:
patent: 5650947 (1997-07-01), Okumura

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