Method and apparatus for testing integrated circuits using AC te

Details Method and apparatus for testing integrated circuits using AC te Method and apparatus for testing integrated circuits using AC te

1980-07-30

1985-03-19

Strecker, Gerard R.

Electricity: measuring and testing

Plural, automatically sequential tests

324 57SS, G01R 1512, G01R 2700

Patent

active

045062129

ABSTRACT:
An integrated circuit is tested by applying to it the output of a clocked word generator. The resulting output from the circuit is analyzed by a phase sensitive detector comprising a series of sampling switches and integrators which are synchronized with the generator frequency. The output spectrum is compared with that of a reference to evaluate the quality of the circuit.

REFERENCES:
patent: 3602809 (1971-08-01), Tarui et al.
patent: 3723868 (1973-03-01), Foster
patent: 4055801 (1977-10-01), Pike et al.
patent: 4129826 (1978-12-01), Mills
Jacobsen, "Swept-Frequency . . . " Hewlett-Packard Journal vol. 29, No. 9, May 1978, p. 24.

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