Circuit for testing circuit blocks controlled by microinstructio

Details Circuit for testing circuit blocks controlled by microinstructio Circuit for testing circuit blocks controlled by microinstructio

1994-06-27

1995-03-14

Atkinson, Charles E.

Excavating

371 223, 371 225, G06F 1100

Patent

active

053982509

ABSTRACT:
The test circuit of this invention is used for testing the circuit blocks of an integrated circuit device controlled by microinstructions. The test circuit includes a microinstruction register. This test circuit holds both a microinstruction read out of a micro-ROM and a control signal set externally to test the circuit blocks of the integrated circuit device. The control signal set in the microinstruction register is decoded by a microdecoder to test the operations of the circuit blocks.

REFERENCES:
patent: 3603936 (1971-09-01), Attwood
patent: 3786434 (1974-01-01), Frye et al.
patent: 4305125 (1981-12-01), Sato et al.
patent: 4313200 (1982-01-01), Nishiura
patent: 4342084 (1982-07-01), Sager et al.
patent: 4604746 (1986-08-01), Blum
patent: 4621363 (1986-11-01), Blum
patent: 4672534 (1987-06-01), Kamiya
patent: 4697267 (1987-09-01), Wakai
patent: 4710927 (1987-12-01), Miller
patent: 4720811 (1988-01-01), Yamaguchi et al.
patent: 4811345 (1989-03-01), Johnson
patent: 4823307 (1989-04-01), Melgara et al.
patent: 4876645 (1989-10-01), Shioya et al.
patent: 4920538 (1990-04-01), Chan et al.
patent: 4924469 (1990-05-01), Tamaru et al.
patent: 4949238 (1990-08-01), Kamiya
patent: 5043985 (1991-08-01), Lin et al.
patent: 5077740 (1991-12-01), Kanuma
Guildford, Surrey, GB; Y. Nozuyama et al., "Design for Testability of a 32-bit TRON Microprocessor", Microprocessors & Microsystems, vol. 13, No. 1, Jan. 1989, pp. 17-27.
Electro '86 & Mini/Micro Northeast, No. 11, 1986, Conference Record, pp. 23/2, 1-19.
F. P. M. Beenker et al., "Macro Testing: Unifying IC and Board Test", IEEE Design & Test of Computers, vol. 3, No. 6, Dec. 1986, pp. 26-32.
European Search Report.

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