Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1997-04-07
1999-09-28
Guay, John
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
216 61, 438 18, 257428, 324769, H01L 2358
Patent
active
059593091
ABSTRACT:
A monitor has been developed for measuring charging currents and voltages in a plasma environment. An antenna in the form of a small aluminum pad is connected to ground through a blocking diode, a blocking transistor, and a storage capacitor. The blocking transistor controls the flow of charge to the capacitor, its control gate being activated by a string of photodiodes that are exposed to the plasma. In a second embodiment, the photodiodes are omitted and the gate is connected directly to the antenna. This ensures that the capacitor charges only while the plasma is on. Once the plasma process has been completed, the monitor may be interrogated at leisure by reading the voltage stored on the capacitor. A resistor, connected in parallel with the capacitor, allows current, as well as voltage, measurements to be made. By using either n-channel or p-channel MOSFETs, electron charging or ion charging respectively may be measured. A plurality of such monitors are implemented on a single chip, each monitor using a resistor of a different value. This allows the I-V characteristics of the plasma to be determined.
REFERENCES:
patent: 5434108 (1995-07-01), Ko et al.
patent: 5514623 (1996-05-01), Ko et al.
patent: 5598009 (1997-01-01), Bui
JP McVittie, "International Symposium on Plasma Process-Induced Damage" Proceeding of the 1966, p. 7-10, Pubin American Vacuum Society.
Ma&McVittie, "International Symposium on Plasma Process-Induced Damage" Proceedings of the 1966, p. 20-23, Pubin American Vacuum Society.
W. Lukaszek et al. International Symposium on Plasma Process-Induced Damage, Proceeding of the 1966, p. 30-33, Pubin American Vacuum Society.
Tsui Bing-Yue
Yang Tzung-zu
Ackerman Stephen B.
Guay John
Industrial Technology Research Institute
Saile George O.
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