Processor condition sensing circuits, systems and methods

Details Processor condition sensing circuits, systems and methods Processor condition sensing circuits, systems and methods

1992-02-04

2000-02-29

Baker, Stephen M.

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

714 34, 714726, G01R 313177, G01R 313185

Patent

active

060322683

ABSTRACT:
The invention provides improved architectures and methods for emulation, simulation, and testability of data processing devices and systems without requiring physical probing or special test fixtures. A data processing device may include a semiconductor chip that is divided into domains. One domain may be halted and tested while another domain continues to operate. For example, the semiconductor chip may have a electronic processor domain and an analysis domain. The analysis domain may include an on-chip condition sensor that is connected to the electronic processor domain. The chip can further include control logic circuitry to allow the analysis domain to operate while the electronic processor is halted and tested.

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