Semiconductor device in which an anti-reflective layer is formed

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257413, 257437, 257639, 257640, 257646, 257649, H01L 2976

Patent

active

058313214

ABSTRACT:
A semiconductor device in which dry etching properties are rendered compatible with satisfactory anti-reflection characteristics in far-infrared lithography the semiconductor device has a semiconductor substrate and an electrode and wire pattern on the substrate. The semiconductor device also has an anti-reflective layer on the substrate which presents a variation in the composition of a constituent element along the film thickness over the semiconductor substrate. The anti-reflective layer is selected from the group consisting of SiO.sub.x, SiN.sub.x and Si.sub.x O.sub.y N.sub.z.

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