Static information storage and retrieval – Read/write circuit – Bad bit
Patent
1998-07-15
1999-04-27
Nelms, David
Static information storage and retrieval
Read/write circuit
Bad bit
36523006, 365201, 36523008, G11C 700
Patent
active
058986278
ABSTRACT:
To make a read/write test on a redundant memory and to realize the detection of faults of the redundant memory cell array in advance, there are provided a first control circuit which inhibits the activation of word lines for selecting a normal memory cell array in response to a test signal and a second control circuit which activates redundant word lines for selecting a redundant memory cell array in response to the test signal.
REFERENCES:
patent: 5349556 (1994-09-01), Lee
Lam David
Nelms David
OKI Electric Industry Co., Ltd.
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