SOG etchant gas and method for using same

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

1566461, 1566571, 437228, 437195, H01L 213065

Patent

active

058141863

ABSTRACT:
An etchant gas and process for using the etchant gas is provided for removing a spin-on glass (SOG) material. The gas composition is chosen as a combination of CHF.sub.3, O.sub.2 and Ar inserted into a parallel electrode reactor. The reactor pressure is maintained between 755 to 845 mTorr while the rf power is maintained at approximately 400 watts. CHF.sub.3 flow rate is optimally chosen between 55 and 65 sccm, with O.sub.2 flow rate approximately equal to 15 sccm and Ar flow rate approximately equal to 266 sccm. The processing parameters are optimally chosen to remove SOG at a rate exceeding 1.5 times the rate in which underlying TEOS-based oxide is removed. Accordingly, the present gas composition and processing methodology ensures SOG is completely removed in thicker areas overlying sparsely spaced interconnect, and that underlying oxide is not removed beneath thinner SOG residing above densely spaced interconnect. The process sequence is chosen having a single etch step, with substantial improvements in SOG etch rate so as to improve wafer throughput.

REFERENCES:
patent: 4326911 (1982-04-01), Howard et al.
patent: 4952274 (1990-08-01), Abraham
patent: 5021121 (1991-06-01), Groechel et al.
patent: 5171401 (1992-12-01), Roselle
patent: 5219793 (1993-06-01), Cooper et al.
patent: 5242538 (1993-09-01), Hamrah et al.
patent: 5254494 (1993-10-01), Van Der Plas et al.
patent: 5316980 (1994-05-01), Takeshiro
patent: 5399527 (1995-03-01), Tabara
patent: 5401998 (1995-03-01), Chiu et al.
patent: 5461010 (1995-10-01), Chen et al.
patent: 5472829 (1995-12-01), Ogawa
patent: 5529948 (1996-06-01), Lur et al.
patent: 5534731 (1996-07-01), Cheung
patent: 5571751 (1996-11-01), Chung
Wolf, "Silicon Processing for the VLSI Era Process Integration", p. 198, 1990.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

SOG etchant gas and method for using same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with SOG etchant gas and method for using same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SOG etchant gas and method for using same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-683235

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.