Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Patent
1997-01-06
1999-04-27
Niebling, John F.
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
438151, 438154, 438163, 438164, H01L 2100
Patent
active
058973443
ABSTRACT:
Method of improving making contact with the source/drain regions of thin-film transistors. A substantially triangular insulator determines contacts with the source/drain regions by a self-aligning process. The width of this insulator can be determined without performing mask alignment. Furthermore, the width can be reduced. Therefore, the sheet resistance of the source/drain regions presents no serious problems.
REFERENCES:
patent: 4638347 (1987-01-01), Iyer
patent: 5289030 (1994-02-01), Yamazaki et al.
patent: 5308998 (1994-05-01), Yamazaki et al.
patent: 5341012 (1994-08-01), Misawa et al.
patent: 5407837 (1995-04-01), Eklund
patent: 5426062 (1995-06-01), Hwang
"Tapered Sidewall Field-Effect Transistor Gates", IBM Tech Disclosure Bulletin, vol. 29, No. 7, Dec. 1986.
IBM Technical Disclosure Bulletin, vol. 29, No. 7, Dec. 1986, p. 2913, "Tapered Sidewall Field-Effect Transistor Gates".
Takemura Yasuhiko
Teramoto Satoshi
Zhang Hongyong
Costellia Jeffrey L.
Ferguson Jr. Gerald J.
Gurley Lynne A.
Niebling John F.
Semiconductor Energy Laboratory Co,. Ltd.
LandOfFree
Method of making a thin film semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making a thin film semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a thin film semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-680945