Structure of a high voltage transistor in a semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257395, 257396, 257397, 257398, 257399, 257488, 437 41, 437 80, 437228, 437984, 148DIG143, H01L 2976, H01L 2994, H01L 31062, H01L 31113

Patent

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056524587

ABSTRACT:
The present invention discloses a structure of a transistor in a semiconductor device and a method of manufacturing the same.
The present invention manufactures a high voltage transistor by etching a silicon substrate to a depth deeper than that of the field oxide film by a self-aligned wet etching process using the field oxide film as a mask and, thereafter, by forming the first gate electrode which electrically switches ON and OFF between the source region and the drain region by using a gate electrode mask and simultaneously forming a second gate electrode to prevent a junction breakdown below the bird's beak of the field oxide film.
Accordingly, the present invention can improve the degree of integration of the device by forming a gate electrode to prevent a junction breakdown below the bird's beak of the field oxide film.

REFERENCES:
patent: 5200351 (1993-04-01), Hadijizadeh-Amini

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