Method for eliminating laser-induced substrate fissures associat

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156643, 156662, 156617R, 156620, 156DIG64, 156DIG80, 156DIG111, 156DIG88, 219121LE, 219121LF, B44C 122, C03C 1500, C03C 2506, C30B 1306

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045362513

ABSTRACT:
A method for eliminating laser induced substrate fissures associated with laser annealed crystallization of patterned silicon areas, for increasing the yield of useable single crystal areas. The fissures are created by enhanced etching of the substrate, at the exposed edges of the areas, during the removal of a dimension stabilizing encapsulating layer. A post crystallization, high temperature anneal, in an oxidizing atmosphere prevents the enhanced etching of the substrate.

REFERENCES:
patent: 4330363 (1982-05-01), Biegesen et al.
patent: 4388145 (1983-06-01), Hawkins et al.

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