Test circuit for identifying open and short circuit defects in a

Details Test circuit for identifying open and short circuit defects in a Test circuit for identifying open and short circuit defects in a

1997-04-24

2000-02-22

Snow, Walter E.

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

324537, G06F 702

Patent

active

060284420

ABSTRACT:
A liquid crystal display is modified to support exhaustive, quantitative testing after assembly while requiring only a limited number of test pads. Multiple data lines are connected to form data line blocks on-board the display but outside the active area of the array for testing purposes. Each data line block is connected to a corresponding test pad via a control switch, the control switches being preferably formed of TFTs and controlled by test gate lines arranged perpendicular to the data lines in matrix form.

REFERENCES:
patent: 5546013 (1996-08-01), Ichioka

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